Среди разнообразных методов исследования структуры поверхности в последние годы \nуспешно применяются методы, основанные на изучении характеристик рассеяния ионов. \nМонография L.Feldman, J. Mayer, T. Picraux , «Каналирование ионов в исследовании материалов» посвящена очень широкому кругу вопросов п
Materials Analysis by Ion Channeling. Submicron crystallography
✍ Scribed by Feldman L.C., Mayer J.W., Picraux S.T.
- Publisher
- Academic Press
- Year
- 1982
- Tongue
- English
- Leaves
- 304
- Category
- Library
No coin nor oath required. For personal study only.
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