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Mapping the Strain Distributions in Deformed Bulk Metallic Glasses Using Hard X-Ray Diffraction

โœ Scribed by J. Bednarcik; L. Y. Chen; X. D. Wang; J. Z. Jiang; H. Franz


Book ID
113087090
Publisher
The Minerals, Metals & Materials Society
Year
2012
Tongue
English
Weight
672 KB
Volume
43
Category
Article
ISSN
1073-5623

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The feasibility of high-resolution strain mapping in bulk samples with both high-spatial and strain resolution is demonstrated using high-energy X-rays between 100 and 300 keV on beam line ID15A at the ESRF. This was achieved by using a multiple-peak Pawley-type refinement on the recorded spectra. A