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Mapping Residual Stress Distributions at the Micron Scale in Amorphous Materials

✍ Scribed by Bartlomiej Winiarski; Richard M. Langford; Jiawan Tian; Yoshihiko Yokoyama; Peter K. Liaw; Philip J. Withers


Book ID
107443855
Publisher
The Minerals, Metals & Materials Society
Year
2009
Tongue
English
Weight
970 KB
Volume
41
Category
Article
ISSN
1073-5623

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