Fabrication of two-dimensional in-plane
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D Reuter; C Meier; A Seekamp; A.D Wieck
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Article
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2002
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Elsevier Science
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English
β 72 KB
In-plane-gate (IPG) transistors have been fabricated using focused ion beam implantation doping of GaAs=In0:1Ga0:9As= Al0:35Ga0:65As heterostructures. At room temperature in the dark, the devices show good transistor characteristics and-in contrast to IPG transistors deΓΏned by insulation writing usi