Structure of amorphous metal-metalloid a
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B.T. Williams; S.J. Gurman; J.C. Amiss
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Article
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1995
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Elsevier Science
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English
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EXAFS data has been obtained for both K absorption edges of amorphous Gel \_xTi~ samples prepared in thin film form by RF sputtering over the composition range 0 < x < 0.7. The data have been analysed both conventionally and by means of Reverse Monte Carlo simulation. All samples show a degree of ch