β Scribed by B.T. Williams; S.J. Gurman; J.C. Amiss
No coin nor oath required. For personal study only.
EXAFS data has been obtained for both K absorption edges of amorphous Gel _xTi~ samples prepared in thin film form by RF sputtering over the composition range 0 < x < 0.7. The data have been analysed both conventionally and by means of Reverse Monte Carlo simulation. All samples show a degree of chemical order. The coordination numbers, both partial and total, vary significantly across the composition range. SAXS data show that no samples are phase separated but contain voids on the 10-20 A scale. The structural information obtained from the EXAFS data is used to aid our understanding of the metal-insulator transition exhibited by these alloys.
π SIMILAR VOLUMES
A microscopic calculation of the chemical short-range order (CSRO) in the FexB ~\_~ metallic glasses is presented. The atomic structure of amorphous metal-metalloid alloys is simulated by using an extended Bethe lattice in which different coordination numbers for Fe and B atoms are taken into accoun