Magnetic field-direction dependence of critical current density in c-axis oriented Bi2Sr1.7La0.3CuO6+y films
โ Scribed by Takeshi Fukami; Dian-hong Lee; Christos Panagopoulos; Terukazu Nishizaki; Fusao Ichikawa; Yuuji Horie; Takafumi Aomine
- Publisher
- Elsevier Science
- Year
- 1994
- Tongue
- English
- Weight
- 146 KB
- Volume
- 194-196
- Category
- Article
- ISSN
- 0921-4526
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โฆ Synopsis
The magnetic field-direction dependence of the critical current density is studied for the copper oxide superconducting Bi2Sr2_xLaxCuO6+y films prepared by the laser ablation technique. Experimental results are discussed on the basis of the two dimensional properties of magnetic flux lines.
๐ SIMILAR VOLUMES
The critical current densities across grain boundaries have been measured as a fonction of the in-plane crystallographic orientations of c-axis Y1Ba2Cu307 thin films grown on different lattice-mismatched substrates by inverted-cylindrical-magnetron sputtering technique. The in-plane orientation of t
Anisotropic magnetic-field dependence of the critical current density (Jc) of polycrystalline YBa2Cu307\_6 thin films deposited on (lO0)MgO, (lO0)SrTiO 3 and a-axis oriented BaSnO 3 was studied. For the films on MgO. Jc changes from Jc(B//substrate surface)~ IXlO 5 A/cm 2 to Jc(BJ. substrate surfac