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Magnetic depth profiles in strained nickel thin films measured by polarized neutron reflectometry

✍ Scribed by F. Ott; C. Fermon

Book ID: 114227276
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 323 KB
Volume: 165
Category: Article
ISSN: 0304-8853
DOI: 10.1016/s0304-8853(96)00596-3

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