The scattering length density profile for a thin film structure can be determined uniquely if both the modulus and phase of the reflection coefficient is known. Here, we describe a method for recovering the phase information which utilize a magnetic substrate and based on polarization analysis of th
โฆ LIBER โฆ
Magnetic alignment in spin-valve system studied by polarized neutron reflectometry
โ Scribed by A. van der Graaf; A.R. Ball; J.C.S. Kools
- Book ID
- 114227277
- Publisher
- Elsevier Science
- Year
- 1997
- Tongue
- English
- Weight
- 273 KB
- Volume
- 165
- Category
- Article
- ISSN
- 0304-8853
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