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Macroscopic simulation of quantum mechanical effects in 2-D MOS devices via the density gradient method

✍ Scribed by Connelly, D.; Zhiping Yu; Yergeau, D.

Book ID: 114539045
Publisher: IEEE
Year: 2002
Tongue: English
Weight: 578 KB
Volume: 49
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.992871

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