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Macroscopic self-consistent model for external-reflection near-field microscopy

โœ Scribed by Berntsen, S.; Bozhevolnaya, E.; Bozhevolnyi, S.

Book ID
115387108
Publisher
Optical Society of America
Year
1993
Tongue
English
Weight
900 KB
Volume
10
Category
Article
ISSN
1084-7529

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The method of calculation of near-field images and near-field luminescence images of semiconductor surface with exciton cloud and nanostructure is proposed. The method is based on Green function technique in the frame of concept of local-filed. The main characteristic of the proposed approach is max