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Luminescence yield spectra through X-ray excitation - optical XAFS

โœ Scribed by T. Murata; K. Harada; S. Emura; T. Moriga; M. Nomura; K.R. Bauchspiess; H. Maeda


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
507 KB
Volume
319
Category
Article
ISSN
0168-9002

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The analytical feasibility of x-ray excited optical luminescence (XEOL) was examined using synchrotron radiation. Decay spectra of XEOL from a plastic scintillator and Y 3 Al 5 O 12 : Ce were measured using single bunch operation of the storage ring, and chemical state selectivity of XEOL detection