Synchrotron radiation x-ray excited optical luminescence for chemical state selective analysis
✍ Scribed by Shinjiro Hayakawa; Takehide Hirose; Liang Yan; Makoto Morishita; Hiroaki Kuwano; Yohichi Gohshi
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 87 KB
- Volume
- 28
- Category
- Article
- ISSN
- 0049-8246
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✦ Synopsis
The analytical feasibility of x-ray excited optical luminescence (XEOL) was examined using synchrotron radiation. Decay spectra of XEOL from a plastic scintillator and Y 3 Al 5 O 12 : Ce were measured using single bunch operation of the storage ring, and chemical state selectivity of XEOL detection was used for selective measurements of x-ray absorption fine structure (XAFS) spectra from a mixture of ZnS and ZnO. To obtain a reliable XAFS spectrum using the XEOL yield, spectral deformation was explained with a simple model similar to those used for primary x-ray fluorescence intensity.