Luminescence of isoelectronically ion-im
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Salh, Roushdey ;Fitting Kourkoutis, L. ;Schmidt, B. ;Fitting, H.-J.
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Article
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2007
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John Wiley and Sons
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English
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## Abstract Scanning electron microscopy (SEM) and cathodoluminescence (CL) in combination with scanning transmission electron microscopy (STEM) have been used to investigate thermally grown amorphous silicon dioxide layers implanted isoelectronically with group IV ions (C^+^, Si^+^, Ge^+^, Sn^+^,