Observation of defect formation process
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M. Watanabe; T. Yoshida; T. Tanabe; S. Muto; A. Inoue; S. Nagata
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Article
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2006
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Elsevier Science
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English
โ 140 KB
We have performed in situ measurements of luminescence from silica glass induced by H + beam at various energies to investigate the dynamic defect formation process in a silica glass. The luminescence spectra showed a broad emission band centered at around 2.7 eV assigned to B 2a oxygen deficient ce