𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Low temperature resistivity of thin film and bulk samples of CuAl2 and Cu9Al4

✍ Scribed by C. Macchioni; J.A. Rayne; S. Sen; C.L. Bauer


Publisher
Elsevier Science
Year
1981
Tongue
English
Weight
428 KB
Volume
81
Category
Article
ISSN
0040-6090

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Low temperature phonon and X-ray photoel
✍ E. Faulques; G. Garz; C. Gonzalez; P. MoliniΓ©; T.P. Nguyen πŸ“‚ Article πŸ“… 1994 πŸ› Elsevier Science 🌐 English βš– 273 KB

The temperature dependence of the 340 cm "1 phonon frequency and linewidth has been measured for the exciting red laser line at 1.834 eV and shows anomalies below Tc. In the O ls XPS spectrum a new peak occurs at 534 eV when T reaches i1014L 0921-4534/94/S07.00 Β© 1994 -Elscvicr Scicncc B V All right

Stacked gate insulator of photooxide and
✍ Yukihiko Nakata; Tetsuya Okamoto; Takashi Itoga; Toshimasa Hamada; Yutaka Ishii πŸ“‚ Article πŸ“… 2003 πŸ› John Wiley and Sons 🌐 English βš– 1019 KB

A stacked gate insulator consisting of photooxide and PECVD film prepared from SiH 4 and N 2 O for use in low-temperature poly-Si thin-film transistors has been developed. The rate of photooxidation using a Xe excimer lamp is the same for (100) and (111) single-crystal Si wafers, and SiO 2 with good