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Low-temperature modifications in the defect structure of amorphous silicon probed by in situ Raman spectroscopy

✍ Scribed by Battaglia, A.; Coffa, S.; Priolo, F.; Compagnini, G.; Baratta, G. A.


Book ID
120516621
Publisher
American Institute of Physics
Year
1993
Tongue
English
Weight
587 KB
Volume
63
Category
Article
ISSN
0003-6951

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