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Low-temperature mobility behaviour in submicron MOSFETs and related determination of channel length and series resistance

✍ Scribed by Ch. Nguyen-Duc; S. Cristoloveanu; G. Ghibaudo


Publisher
Elsevier Science
Year
1986
Tongue
English
Weight
614 KB
Volume
29
Category
Article
ISSN
0038-1101

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