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Low temperature LEED and electric conductivity measurements for cleaved Si(111) surfaces

✍ Scribed by V.Yu. Aristov; I.E. Batov; V.A. Grazhulis

Publisher: Elsevier Science
Year: 1983
Weight: 52 KB
Volume: 132
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(83)90152-4

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