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Low-temperature growth and interface characterization of BiFeO3 thin films with reduced leakage current

✍ Scribed by Lee, Yi-Hsien; Wu, Jenn-Ming; Chueh, Yu-Lun; Chou, Li-Jen

Book ID
118747441
Publisher
American Institute of Physics
Year
2005
Tongue
English
Weight
491 KB
Volume
87
Category
Article
ISSN
0003-6951

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For the purpose of fabricating alI-YBCO S-N-S Josephson junctions, thin films of YBa2Cu3OT\_~ (YBCO) with reduced critical temperature (YBCO\*) were prepared by means of DC-magnetron sputtering. The YBCO\* films showed a critical temperature around 70 K which could not be increased by an oxygen or o