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Low-temperature exciton trapping on interface defects in semiconductor quantum wells

✍ Scribed by Bastard, G.; Delalande, C.; Meynadier, M. H.; Frijlink, P. M.; Voos, M.

Book ID: 120550526
Publisher: The American Physical Society
Year: 1984
Tongue: English
Weight: 190 KB
Volume: 29
Category: Article
ISSN: 1098-0121
DOI: 10.1103/PhysRevB.29.7042

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