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Low Temperature Electronic Transport in RuO2-Based Cermet Resistors

✍ Scribed by M. Affronte; M. Campani; S. Piccinini; M. Tamborin; B. Morten; M. Prudenziati; O. Laborde

Publisher
Springer US
Year
1997
Tongue
English
Weight
736 KB
Volume
109
Category
Article
ISSN
0022-2291

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Fracture resistance evaluation of RuO2-b
Fracture resistance evaluation of RuO2-based thick film resistor material by in situ crack extension observation in a scanning electron microscope
✍ Niko Sebastian Dorsch; Ilya Peshekhodov; Philipp Spies; Gerold A. Schneider πŸ“‚ Article πŸ“… 2008 πŸ› Elsevier Science 🌐 English βš– 663 KB

Parameters for the fracture mechanics of thick film materials are scarce in the literature. One reason is that for many such materials it is very difficult to produce a bulk specimen as required for most standard tests. This paper describes an alternative method for measuring the fracture resistance