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Low-frequency Raman scattering from small silver particles embedded in SiO2 thin films

✍ Scribed by Fujii, M.; Nagareda, T.; Hayashi, S.; Yamamoto, K.

Book ID
111682356
Publisher
The American Physical Society
Year
1991
Tongue
English
Weight
566 KB
Volume
44
Category
Article
ISSN
1098-0121

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Silicon nanocrystals (nc-Si) embedded in SiO 2 glassy mixture have been prepared on glass substrates and silicon and germanium wafers by r.f. co-sputtering and post-annealing in a vacuum. Using Raman spectrometry, photoluminescence and electrical conductivity measurements, we have investigated the s