Low-frequency noise in SOI pseudo-MOSFET with pressure probes

✍ Scribed by A. El Hajj Diab; I. Ionica; S. Cristoloveanu; F. Allibert; Y.H. Bae; J.A. Chroboczek; G. Ghibaudo

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 565 KB
• Volume: 88
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2011.03.096