Low-Frequency Noise in Enhancement-Mode GaN MOS-HEMTs by Using Stacked Gate Dielectric

✍ Scribed by Hsien-Chin Chiu; Jia-Hsuan Wu; Chih-Wei Yang; Fan-Hsiu Huang; Hsuan-Ling Kao

• Book ID: 118036291
• Publisher: IEEE
• Year: 2012
• Tongue: English
• Weight: 411 KB
• Volume: 33
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/led.2012.2194980