Low-frequency noise characterization of latent damage in thin oxides subjected to high-field impulse stressing

✍ Scribed by W. Chim; B. Yeo; P. Lim; D. Chan

• Book ID: 126759199
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 92 KB
• Volume: 19
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.720187