Low-frequency drain current noise behavior of InP based MODFET's in the linear and saturation regime

✍ Scribed by Van Meer, H.; Simoen, E.; Valenza, M.; Van Der Zanden, K.; De Raedt, W.

• Book ID: 114537498
• Publisher: IEEE
• Year: 1998
• Tongue: English
• Weight: 281 KB
• Volume: 45
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.735724