✦ LIBER ✦

Low energy spin polarized radioactive beams as a probe of thin films and interfaces

✍ Scribed by R.F. Kiefl; W.A. MacFarlane; P. Amaudruz; D. Arseneau; R. Baartman; T.R. Beals; J. Behr; J. Brewer; S. Daviel; A. Hatakeyama; B. Hitti; S.R. Kreitzman; C.D.P. Levy; R. Miller; M. Olivo; R. Poutissou; G.D. Morris; S.R. Dunsiger; R. Heffner; K.H. Chow; Y. Hirayama; H. Izumi; C. Bommas; E. Dumont; L.H. Greene

Book ID: 114166845
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 208 KB
Volume: 204
Category: Article
ISSN: 0168-583X
DOI: 10.1016/s0168-583x(03)00479-8

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Low energy muons as probes of thin films

Low energy muons as probes of thin films and surfaces

✍ E. Morenzoni 📂 Article 📅 1997 🏛 Springer Vienna 🌐 English ⚖ 542 KB

Low angle X-ray diffraction as a probe o

Low angle X-ray diffraction as a probe of reactions at buried interfaces and as characterization technique for thin films

✍ Thomas Novet; Stephen Kevan; David C. Johnson 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 636 KB

Erosion of a-C:D thin films by low energ

Erosion of a-C:D thin films by low energy D+, , and ion beam irradiation

✍ F.W. Meyer; P.R. Harris; H. Zhang; W. Jacob; T. Schwarz-Selinger; U. von Toussai 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 443 KB

Ultrasoft X-ray spectroscopy with variat

Ultrasoft X-ray spectroscopy with variation of the electron excitation energy as a method for analyzing thin films and solid/solid interfaces

✍ V. R. Galakhov; S. N. Shamin 📂 Article 📅 2009 🏛 Allerton Press Inc 🌐 English ⚖ 160 KB

Thin-film beam splitter that reflects li

Thin-film beam splitter that reflects light as a half-wave retarder and transmits it without change of polarization: application to a Michelson interferometer

✍ Azzam, R. M. A. 📂 Article 📅 1986 🏛 Optical Society of America 🌐 English ⚖ 606 KB

Preferential c-axis orientation and diel

Preferential c-axis orientation and dielectric constants of thin BaTiO3 films deposited on Si wafers by a low energy ion beam assisted deposition technique

✍ Katsuhiro Yokota; Hiroshi Morigou; Fumiyoshi Miyashita 📂 Article 📅 2007 🏛 Elsevier Science 🌐 English ⚖ 213 KB

Thin BaTiO 3 films were deposited on thin TiN film covered Si wafers by ion beam assisted deposition comprising of two electron beam evaporators for evaporating Ti and BaCO 3 and an electron cyclotron resonance ion source for ionizing O 2 . Films deposited using 25 eV oxygen ion beams had many small