✦ LIBER ✦
Low angle X-ray diffraction as a probe of reactions at buried interfaces and as characterization technique for thin films
✍ Scribed by Thomas Novet; Stephen Kevan; David C. Johnson
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 636 KB
- Volume
- 195
- Category
- Article
- ISSN
- 0921-5093
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