𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Low energy electron point source microscopy

✍ Scribed by H.J. Kreuzer


Publisher
Elsevier Science
Year
1995
Tongue
English
Weight
768 KB
Volume
26
Category
Article
ISSN
0968-4328

No coin nor oath required. For personal study only.

✦ Synopsis


The setup of the LEEPS (low energy electron point source) microscope is described and images of carbon fibres and nanotubes are shown and compared to simulated images. We used a Kirchhoff-Helmholtz type transform to reconstruct the (wave front at the) object. We also showed that this transform can be used to reconstruct optical in-line holograms.


πŸ“œ SIMILAR VOLUMES


Electron optics for dual-beam low energy
✍ Marian Mankos πŸ“‚ Article πŸ“… 2011 πŸ› Elsevier Science 🌐 English βš– 710 KB

Dual-beam low energy electron microscopy (LEEM) is a novel imaging technique that extends LEEM applications to non-conductive substrates. In dual-beam LEEM, two flood beams with opposite charging characteristics illuminate the field of view in order to mitigate the charging effects occurring when su