Dual-beam low energy electron microscopy (LEEM) is a novel imaging technique that extends LEEM applications to non-conductive substrates. In dual-beam LEEM, two flood beams with opposite charging characteristics illuminate the field of view in order to mitigate the charging effects occurring when su
β¦ LIBER β¦
Low energy electron point source microscopy
β Scribed by H.J. Kreuzer
- Publisher
- Elsevier Science
- Year
- 1995
- Tongue
- English
- Weight
- 768 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0968-4328
No coin nor oath required. For personal study only.
β¦ Synopsis
The setup of the LEEPS (low energy electron point source) microscope is described and images of carbon fibres and nanotubes are shown and compared to simulated images. We used a Kirchhoff-Helmholtz type transform to reconstruct the (wave front at the) object. We also showed that this transform can be used to reconstruct optical in-line holograms.
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