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Low Energy Electron Induced DNA Damage: Effects of Terminal Phosphate and Base Moieties on the Distribution of Damage

✍ Scribed by Li, Zejun; Zheng, Yi; Cloutier, Pierre; Sanche, Léon; Wagner, J. Richard


Book ID
124168389
Publisher
American Chemical Society
Year
2008
Tongue
English
Weight
81 KB
Volume
130
Category
Article
ISSN
0002-7863

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