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Low-Energy Electron-Induced DNA Damage: Effect of Base Sequence in Oligonucleotide Trimers

✍ Scribed by Li, Zejun; Cloutier, Pierre; Sanche, Léon; Wagner, J. Richard

Book ID: 121810369
Publisher: American Chemical Society
Year: 2010
Tongue: English
Weight: 286 KB
Volume: 132
Category: Article
ISSN: 0002-7863
DOI: 10.1021/ja9099505

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## Abstract **Low‐energy electrons** (LEEs) interact with a DNA model system to create a variety of excited states. In the gas phase, dissociative (σ\*) states are accessible by LEEs with energy <4 eV (see picture) and cause facile strand breaks through a dissociative electron attachment mechanism.