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Low energy electron diffraction analysis of the Si(111)7x7 structure: S Y Tong et al, J Vac Sci Technol, A6, 1988, 615–624

Publisher: Elsevier Science
Year: 1989
Tongue: English
Weight: 154 KB
Volume: 39
Category: Article
ISSN: 0042-207X
DOI: 10.1016/0042-207x(89)90604-0

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📂 Article 📅 1989 🏛 Elsevier Science 🌐 English ⚖ 149 KB