✦ LIBER ✦

Low-cost physical analysis techniques for the failure analysis of semiconductor components

✍ Scribed by J. Y. Glacet; G. Guerri Dall'oro

Book ID: 112184719
Publisher: John Wiley and Sons
Year: 1992
Tongue: English
Weight: 643 KB
Volume: 8
Category: Article
ISSN: 0748-8017
DOI: 10.1002/qre.4680080204

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Physical Analysis of Stress Testing for

Physical Analysis of Stress Testing for Failure of Electronic Components

✍ Kooi, Clarence F. 📂 Article 📅 1968 🏛 IEEE 🌐 English ⚖ 871 KB

Depth profiling techniques for the eleme

Depth profiling techniques for the elemental analysis of semiconductor layers

✍ DE Sykes 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 260 KB

Stability analysis of low-cost digital c

Stability analysis of low-cost digital cameras for aerial mapping using different georeferencing techniques

✍ Ayman Habib; Anoop Pullivelli; Edson Mitishita; Mwafag Ghanma; Eui-Myoung Kim 📂 Article 📅 2006 🏛 John Wiley and Sons 🌐 English ⚖ 251 KB

The application of low-cost multielement

The application of low-cost multielement data by neutron activation analysis suitable for exploration geochemical techniques

✍ E.L. Hoffman; A. Pidruczny 📂 Article 📅 1987 🏛 Elsevier Science 🌐 English ⚖ 92 KB

Failure analysis of the arthroscopic tig

Failure analysis of the arthroscopic tightrope technique for ACJ dislocation

✍ A. Adimonye; E.O. Pearse; T.D. Tennent 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 51 KB

Discussion: New techniques on the horizo

Discussion: New techniques on the horizon for the analysis of the inorganic cometary components

✍ Elmar K. Jessberger 📂 Article 📅 1991 🏛 Springer Netherlands 🌐 English ⚖ 321 KB

ZINNER began the discussion on new instrumentation and techniques to be expected in the next years before comet sample return and pointed out that new as well as existing techniques would continue to be utilised on IDPs and primitive meteorites yielding important and exciting results. As had been de