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Low cost photoelectron yield setup for surface process monitoring

✍ Scribed by Hemmi, Adrian; Cun, Huanyao; Roth, Silvan; Osterwalder, Jürg; Greber, Thomas


Book ID
121789421
Publisher
AVS (American Vacuum Society)
Year
2014
Tongue
English
Weight
477 KB
Volume
32
Category
Article
ISSN
0734-2101

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