๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Low cost hands-on training in microelectronic technologies

โœ Scribed by Haskard, M.R.

Book ID
114532193
Publisher
IEEE
Year
1993
Tongue
English
Weight
776 KB
Volume
36
Category
Article
ISSN
0018-9359

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The heat accumulated in live integrated circuits is becoming more difficult to manage as transistor densities continue to increase at very rapid rates. Two non-invasive thermographic techniques are developed to seek out these thermally active sites which are highly susceptible to failure. One method