Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effects

✍ Scribed by Roy, K.; Prasad, S.

• Book ID: 119773351
• Publisher: IEEE
• Year: 1995
• Tongue: English
• Weight: 450 KB
• Volume: 44
• Category: Article
• ISSN: 0018-9529
• DOI: 10.1109/24.387379