Logic synthesis for reliability: an early start to controlling electromigration and hot-carrier effects : Jaushik Roy and Sharat Prasad. IEEE Transactions on Reliability, 44 (2), 251 (June 1995).

• Book ID: 108362323
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 115 KB
• Volume: 37
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/s0026-2714(97)87781-5