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Local structure determination of the Co-Si(111) interface by surface electron energy-loss fine-structure technique

✍ Scribed by E. Chaînet; M. De Crescenzi; J. Derrien; T.T.A. Nguyen; R.C. Cinti

Publisher: Elsevier Science
Year: 1986
Weight: 42 KB
Volume: 168
Category: Article
ISSN: 0167-2584
DOI: 10.1016/0167-2584(86)90502-5

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