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Local compressive stress generation in electron irradiated boron-doped Si0.75Ge0.25/Si devices

✍ Scribed by Isao Tsunoda; Toshiyuki Nakashima; Nobuyuki Naka; Tatsuya Idemoto; Masashi Yoneoka; Kenichiro Takakura; Kenji Yoshino; Mireia Bargallo Gonzalez; Eddy Simoen; Cor Claeys; Hidenori Ohyama

Book ID: 112182503
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 340 KB
Volume: 9
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.201200076

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✍ Li, V.Z.-Q.; Mirabedini, M.R.; Kuehn, R.T.; Wortman, J.J.; Ozturk, M.C. 📂 Article 📅 1997 🏛 IEEE ⚖ 355 KB