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Lithium-drifted silicon for harsh radiation environments

✍ Scribed by J. Grant; C. Buttar; M. Brozel; A. Keffous; A. Cheriet; K. Bourenane; A. Bourenane; F. Kezzoula; H. Menari


Book ID
108223462
Publisher
Elsevier Science
Year
2008
Tongue
English
Weight
276 KB
Volume
591
Category
Article
ISSN
0168-9002

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Wide bandgap semiconductor detectors for
✍ J. Grant; W. Cunningham; A. Blue; V. O’Shea; J. Vaitkus; E. Gaubas; M. Rahman πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 378 KB

In this work two wide bandgap materials, silicon carbide (SiC) and gallium nitride (GaN), were investigated for their performance in harsh radiation environments. Schottky devices were fabricated on vanadium doped SiC (V-SiC), Okmetic semi insulating (SI) non-vanadium doped SiC, SI GaN grown by MOCV