The surface tension of liquid N was measured in the temperature range from 80 K up to the liquid-vapor critical point by ?he surface wave resonance method. This new method has the advantage of the precise measurement near the critical point at low temperatures. The present data are in agreement wi
Liquid-vapor critical point of physisorbed films
โ Scribed by James R. Klein; M.H.W. Chan; Milton W. Cole
- Publisher
- Elsevier Science
- Year
- 1984
- Weight
- 57 KB
- Volume
- 148
- Category
- Article
- ISSN
- 0167-2584
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