Linear-Defect-Induced Thermal Instability in YBCO Thin Films in Microwave Fields

✍ Scribed by V. M. Pan; C. G. Tretiatchenko; V. S. Flis; V. A. Komashko; O. A. Kalenyuk; E. A. Pashitskii; A. N. Ivanyuta; G. A. Melkov; H. W. Zandbergen; V. L. Svetchnikov

• Book ID: 111559187
• Publisher: Springer
• Year: 2003
• Tongue: English
• Weight: 673 KB
• Volume: 16
• Category: Article
• ISSN: 0896-1107
• DOI: 10.1023/a:1026267321290