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Line profile study from diode laser spectroscopy in the 12CH4 2ν3 band perturbed by N2, O2, Ar, and He

✍ Scribed by G. Dufour; D. Hurtmans; A. Henry; A. Valentin; M. Lepère

Publisher
Elsevier Science
Year
2003
Tongue
English
Weight
348 KB
Volume
221
Category
Article
ISSN
0022-2852

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✦ Synopsis

We present a line profile study for two lines in the 2m 3 band of CH 4 recorded with a frequency stabilized tunable diode laser spectrometer. The broadening and narrowing (Dicke effect) parameters of the R(0) line perturbed by N 2 , O 2 , and He are derived from a simultaneous fitting of spectra at pressures from 20 to 300 Torr by using the soft and hard collision models. These parameters are determined for the A and F components of the unresolved R(3) manifold perturbed by N 2 , Ar, and He from the line profile analysis of spectra at pressures between 50 and 500 Torr. The line mixing effect between the two F components is also taken into account and the absorber speed dependent effect on broadening is estimated for N 2 and Ar.

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