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Line focus acoustic microscopy to measure anisotropic acoustic properties of thin films

✍ Scribed by Jin O. Kim; Jan D. Achenbach

Publisher: Elsevier Science
Year: 1992
Tongue: English
Weight: 878 KB
Volume: 214
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(92)90451-g

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