Line analysis of interface layer on dentin by means of electron-probe microanalysis

✍ Scribed by Fukushima, Tadao ;Horibe, Takashi

• Publisher: John Wiley and Sons
• Year: 1991
• Tongue: English
• Weight: 596 KB
• Volume: 25
• Category: Article
• ISSN: 0021-9304
• DOI: 10.1002/jbm.820250110

✦ Synopsis

Three types of brominated methacrylates, SBPPM, BPylM, and BNEM, were synthesized. The distribution of Br, Ca, and Fe at the interface between dentin treated with the 10-3 solution and resin containing these monomers was analyzed using an electron-probe microanalyzer (EPMA) in order to predict the composition and thickness of the interface layer on dentin for the corresponding unbrominated methacrylates. There was no significant difference between the brominated and unbrominated methacrylates in either the bond strength to the treated dentin or in the thickness of the interface layer on dentin observed with a scanning electron microscope (SEM). The thickness determined with EPMA was equivalent to that observed with SEM. The concentration of each brominated methacrylate in the interface layer was higher than the original concentration in the resin monomers, and BNEM showed higher concentration than the others. The presence of Fe in the layer was confirmed by EPMA.