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Light Emission and Scanning Electron Microscopic Characterization of Porous Silicon

✍ Scribed by Berrada, K.; Targaoui, H.; Kaddouri, A.; Louarn, G.; Froyer, G.; Outzourhit, A.

Book ID
121509964
Publisher
Taylor and Francis Group
Year
2007
Tongue
English
Weight
332 KB
Volume
40
Category
Article
ISSN
0038-7010

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We have observed scanning tunneling microscope light emission (STM-LE) spectra of Ge 2 Sb 2 Te 5 and Sb 2 Te 3 . Although these chalcogenide alloys exhibit band gaps less than 0.5 eV, the STM-LE was observed with a narrow spectral width at a photon energy of 1.5 eV for both materials. By analyzing i