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Lifetime Tests and Junction-Temperature Measurement of InGaN Light-Emitting Diodes Using Patterned Sapphire Substrates

✍ Scribed by Tsai, P.C.; Chuang, R.W.; Su, Y.K.

Book ID: 115372123
Publisher: Optical Society of America
Year: 2007
Tongue: English
Weight: 263 KB
Volume: 25
Category: Article
ISSN: 0733-8724
DOI: 10.1109/JLT.2006.888234

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