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Lifetime Prediction of Metallized Film Capacitors Based on Capacitance Loss

โœ Scribed by Li, Zhiwei; Li, Hua; Lin, Fuchang; Chen, Yaohong; Liu, De; Wang, Bowen; Zhang, Qin; He, Wei


Book ID
121757642
Publisher
IEEE
Year
2013
Tongue
English
Weight
546 KB
Volume
41
Category
Article
ISSN
0093-3813

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