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[IEEE 2013 International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Novosibirsk, Russia (2013.07.1-2013.07.5)] 2013 14th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - Abnormal electrical capacitance behavior of VO2-films-based microstructures near semiconductor-to-metal phase transition

✍ Scribed by Aliev, Vladimir Sh.; Bortnikov, Sergey G.; Voronkovsky, Vitaliy A.

Book ID: 121650958
Publisher: IEEE
Year: 2013
Weight: 432 KB
Category: Article
ISBN: 1479907618
DOI: 10.1109/EDM.2013.6641938

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